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A systematic study to investigate the effects of X-ray exposure on electrical properties of silicon dioxide thin films using X-ray photoelectron spectroscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Munoz, Carlos, Iken, Thomas, Oncel, Nuri
Format:	Preprint
Published:	2024
Subjects:	Chemical Physics Materials Science
Online Access:	Acceder al recurso
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