Manipulating carbon related spin defects in boron nitride by changing the MOCVD growth temperature

Fuente: arXiv
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Autori principali: Iwański, Jakub, Kierdaszuk, Jakub, Ciesielski, Arkadiusz, Binder, Johannes, Drabińska, Aneta, Wysmołek, Andrzej
Natura: Preprint
Pubblicazione: 2024
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author Iwański, Jakub
Kierdaszuk, Jakub
Ciesielski, Arkadiusz
Binder, Johannes
Drabińska, Aneta
Wysmołek, Andrzej
author_facet Iwański, Jakub
Kierdaszuk, Jakub
Ciesielski, Arkadiusz
Binder, Johannes
Drabińska, Aneta
Wysmołek, Andrzej
contents A common solution for precise magnetic field sensing is to employ spin-active defects in semiconductors, with the NV center in diamond as prominent example. However, the three-dimensional nature of diamond limits the obtainable proximity of the defect to the sample. Two-dimensional boron nitride, which can host spin-active defects, can be used to overcome those limitations. In this work, we study spin properties of sp2-bonded boron nitride layers grown using Metal Organic Chemical Vapor Deposition at temperatures ranging from 700 $^\circ$C to 1200 $^\circ$C. With Electron Spin Resonance (ESR) we show that our layers exhibit spin properties, which we ascribe to carbon related defects. Supported by photoluminescence and Fourier-transform infrared spectroscopy, we distinguish three different regimes: (i) growth at low temperatures with no ESR signal, (ii) growth at intermediate temperatures with a strong ESR signal and a large number of spin defects, (iii) growth at high temperatures with a weaker ESR signal and a lower number of spin defects. The observed effects can be further enhanced by an additional annealing step. Our studies demonstrate wafer-scale boron nitride that intrinsically hosts spin defects without any ion or neutron irradiation, which may be employed in spin memories or magnetic field detectors.
format Preprint
id arxiv_https___arxiv_org_abs_2403_15346
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Manipulating carbon related spin defects in boron nitride by changing the MOCVD growth temperature
Iwański, Jakub
Kierdaszuk, Jakub
Ciesielski, Arkadiusz
Binder, Johannes
Drabińska, Aneta
Wysmołek, Andrzej
Materials Science
A common solution for precise magnetic field sensing is to employ spin-active defects in semiconductors, with the NV center in diamond as prominent example. However, the three-dimensional nature of diamond limits the obtainable proximity of the defect to the sample. Two-dimensional boron nitride, which can host spin-active defects, can be used to overcome those limitations. In this work, we study spin properties of sp2-bonded boron nitride layers grown using Metal Organic Chemical Vapor Deposition at temperatures ranging from 700 $^\circ$C to 1200 $^\circ$C. With Electron Spin Resonance (ESR) we show that our layers exhibit spin properties, which we ascribe to carbon related defects. Supported by photoluminescence and Fourier-transform infrared spectroscopy, we distinguish three different regimes: (i) growth at low temperatures with no ESR signal, (ii) growth at intermediate temperatures with a strong ESR signal and a large number of spin defects, (iii) growth at high temperatures with a weaker ESR signal and a lower number of spin defects. The observed effects can be further enhanced by an additional annealing step. Our studies demonstrate wafer-scale boron nitride that intrinsically hosts spin defects without any ion or neutron irradiation, which may be employed in spin memories or magnetic field detectors.
title Manipulating carbon related spin defects in boron nitride by changing the MOCVD growth temperature
topic Materials Science
url https://arxiv.org/abs/2403.15346