Exploit High-Dimensional RIS Information to Localization: What Is the Impact of Faulty Element?

Fuente: arXiv

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Bibliographic Details
Main Authors:	Wu, Tuo, Pan, Cunhua, Zhi, Kangda, Ren, Hong, Elkashlan, Maged, Wang, Cheng-Xiang, Schober, Robert, You, Xiaohu
Format:	Preprint
Published:	2024
Subjects:	Signal Processing
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.16529