To Err is Machine: Vulnerability Detection Challenges LLM Reasoning

Fuente: arXiv
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Bibliographic Details
Main Authors: Steenhoek, Benjamin, Rahman, Md Mahbubur, Roy, Monoshi Kumar, Alam, Mirza Sanjida, Tong, Hengbo, Das, Swarna, Barr, Earl T., Le, Wei
Format: Preprint
Published: 2024
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