Test-time Adaptation Meets Image Enhancement: Improving Accuracy via Uncertainty-aware Logit Switching

Fuente: arXiv

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Bibliographic Details
Main Authors:	Enomoto, Shohei, Hasegawa, Naoya, Adachi, Kazuki, Sasaki, Taku, Yamaguchi, Shin'ya, Suzuki, Satoshi, Eda, Takeharu
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.17423