Nanoscale Dark-Field Imaging in Full-Field Transmission X-Ray Microscopy
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arXiv
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| Hauptverfasser: | , , , , , |
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| Format: | Preprint |
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2024
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| _version_ | 1866915378309890048 |
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| author | Wirtensohn, Sami Qi, Peng David, Christian Herzen, Julia Greving, Imke Flenner, Silja |
| author_facet | Wirtensohn, Sami Qi, Peng David, Christian Herzen, Julia Greving, Imke Flenner, Silja |
| contents | The dark-field signal uncovers details beyond conventional X-ray attenuation contrast, which is especially valuable for material sciences. In particular, dark-field techniques are able to reveal structures beyond the spatial resolution of a setup. However, its implementation is yet limited to the micrometer regime. Therefore, we propose a technique to extend full-field transmission X-ray microscopy by the dark-field signal. The proposed method is based on a well-defined illumination of a beam-shaping condenser, which allows to block the bright-field by motorized apertures in the back focal plane of the objective's lens. This method offers a simple implementation and enables rapid modality changes while maintaining short scan times, making dark-field imaging widely available at the nanometer scale. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2403_18884 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Nanoscale Dark-Field Imaging in Full-Field Transmission X-Ray Microscopy Wirtensohn, Sami Qi, Peng David, Christian Herzen, Julia Greving, Imke Flenner, Silja Optics Instrumentation and Detectors The dark-field signal uncovers details beyond conventional X-ray attenuation contrast, which is especially valuable for material sciences. In particular, dark-field techniques are able to reveal structures beyond the spatial resolution of a setup. However, its implementation is yet limited to the micrometer regime. Therefore, we propose a technique to extend full-field transmission X-ray microscopy by the dark-field signal. The proposed method is based on a well-defined illumination of a beam-shaping condenser, which allows to block the bright-field by motorized apertures in the back focal plane of the objective's lens. This method offers a simple implementation and enables rapid modality changes while maintaining short scan times, making dark-field imaging widely available at the nanometer scale. |
| title | Nanoscale Dark-Field Imaging in Full-Field Transmission X-Ray Microscopy |
| topic | Optics Instrumentation and Detectors |
| url | https://arxiv.org/abs/2403.18884 |