Prediction and identification of point defect fingerprints in X-ray photoelectron spectra of TiN$_x$ with 1.18 $\le x \le$ 1.37

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ondračka, Pavel, Kümmerl, Pauline, Hans, Marcus, Mráz, Stanislav, Primetzhofer, Daniel, Holec, David, Vašina, Petr, Schneider, Jochen M.
Format:	Preprint
Published:	2024
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.19190