Determining intrinsic sensitivity and the role of multiple scattering in speckle metrology
Fuente:
arXiv
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| Autori principali: | , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2024
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| _version_ | 1866911988964130816 |
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| author | Facchin, Morgan Khan, Saba N. Dholakia, Kishan Bruce, Graham D. |
| author_facet | Facchin, Morgan Khan, Saba N. Dholakia, Kishan Bruce, Graham D. |
| contents | Speckle patterns are a powerful tool for high-precision metrology, as they allow remarkable performance in relatively simple setups. Nonetheless, researchers in this field follow rather distinct paths due to underappreciated general principles underlying speckle phenomena. Here, we advise on a universal metric of intrinsic speckle sensitivity, and on the advantages and disadvantages of multiple scattering. This will catalyse progress in speckle metrology but will also translate to other domains of disordered optics which are undergoing rapid developments at present. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2403_19301 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Determining intrinsic sensitivity and the role of multiple scattering in speckle metrology Facchin, Morgan Khan, Saba N. Dholakia, Kishan Bruce, Graham D. Optics Speckle patterns are a powerful tool for high-precision metrology, as they allow remarkable performance in relatively simple setups. Nonetheless, researchers in this field follow rather distinct paths due to underappreciated general principles underlying speckle phenomena. Here, we advise on a universal metric of intrinsic speckle sensitivity, and on the advantages and disadvantages of multiple scattering. This will catalyse progress in speckle metrology but will also translate to other domains of disordered optics which are undergoing rapid developments at present. |
| title | Determining intrinsic sensitivity and the role of multiple scattering in speckle metrology |
| topic | Optics |
| url | https://arxiv.org/abs/2403.19301 |