Optimizing Josephson Junction Reproducibility in 30 kV E-beam Lithography: Analysis of Backscattered Electron Distribution

Fuente: arXiv
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Bibliographic Details
Main Authors: Rebello, A. M., Ruela, L. M., Moreto, G., Klein, N. Y., Martins, E., Oliveira, I. S., Rouxinol, F., Sinnecker, J. P.
Format: Preprint
Published: 2024
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