Predicting the statistical error of analog particle tracing Monte Carlo

Fuente: arXiv
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Bibliographic Details
Main Authors: Maes, Vince, Bossuyt, Ignace, Vandecasteele, Hannes, Dekeyser, Wouter, Koellermeier, Julian, Baelmans, Martine, Samaey, Giovanni
Format: Preprint
Published: 2024
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