Optimum surface-passivation schemes for near-surface spin defects in silicon carbide

Fuente: arXiv
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Main Authors: Ngomsi, Cyrille Armel Sayou, Joshi, Tamanna, Dev, Pratibha
Format: Preprint
Published: 2024
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_version_ 1866910453530099712
author Ngomsi, Cyrille Armel Sayou
Joshi, Tamanna
Dev, Pratibha
author_facet Ngomsi, Cyrille Armel Sayou
Joshi, Tamanna
Dev, Pratibha
contents Spin-active defects in silicon carbide (SiC) are promising quantum light sources for realizing scalable quantum technologies. In different applications, these photoluminescent defects are often placed in a nanostructured host or close to surfaces in order to enhance the signal from the defects. However, proximity to the surface not only modifies frequencies of the quantum emission from the defect, but also adversely affects their photo-stability, resulting in blinking and/or photobleaching of the defect. These effects can be ameliorated by passivating surfaces with optimal adsorbates. In this work, we explore different passivation schemes using density functional theory-based calculations. We show that a uniform surface passivation with either hydrogen or with mixed hydrogen/hydroxyl groups completely removes surface states from the SiC band gap, restoring the optical properties of the defects.
format Preprint
id arxiv_https___arxiv_org_abs_2404_00393
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Optimum surface-passivation schemes for near-surface spin defects in silicon carbide
Ngomsi, Cyrille Armel Sayou
Joshi, Tamanna
Dev, Pratibha
Materials Science
Spin-active defects in silicon carbide (SiC) are promising quantum light sources for realizing scalable quantum technologies. In different applications, these photoluminescent defects are often placed in a nanostructured host or close to surfaces in order to enhance the signal from the defects. However, proximity to the surface not only modifies frequencies of the quantum emission from the defect, but also adversely affects their photo-stability, resulting in blinking and/or photobleaching of the defect. These effects can be ameliorated by passivating surfaces with optimal adsorbates. In this work, we explore different passivation schemes using density functional theory-based calculations. We show that a uniform surface passivation with either hydrogen or with mixed hydrogen/hydroxyl groups completely removes surface states from the SiC band gap, restoring the optical properties of the defects.
title Optimum surface-passivation schemes for near-surface spin defects in silicon carbide
topic Materials Science
url https://arxiv.org/abs/2404.00393