AETTA: Label-Free Accuracy Estimation for Test-Time Adaptation

Fuente: arXiv
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Autori principali: Lee, Taeckyung, Chottananurak, Sorn, Gong, Taesik, Lee, Sung-Ju
Natura: Preprint
Pubblicazione: 2024
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_version_ 1866917628644163584
author Lee, Taeckyung
Chottananurak, Sorn
Gong, Taesik
Lee, Sung-Ju
author_facet Lee, Taeckyung
Chottananurak, Sorn
Gong, Taesik
Lee, Sung-Ju
contents Test-time adaptation (TTA) has emerged as a viable solution to adapt pre-trained models to domain shifts using unlabeled test data. However, TTA faces challenges of adaptation failures due to its reliance on blind adaptation to unknown test samples in dynamic scenarios. Traditional methods for out-of-distribution performance estimation are limited by unrealistic assumptions in the TTA context, such as requiring labeled data or re-training models. To address this issue, we propose AETTA, a label-free accuracy estimation algorithm for TTA. We propose the prediction disagreement as the accuracy estimate, calculated by comparing the target model prediction with dropout inferences. We then improve the prediction disagreement to extend the applicability of AETTA under adaptation failures. Our extensive evaluation with four baselines and six TTA methods demonstrates that AETTA shows an average of 19.8%p more accurate estimation compared with the baselines. We further demonstrate the effectiveness of accuracy estimation with a model recovery case study, showcasing the practicality of our model recovery based on accuracy estimation. The source code is available at https://github.com/taeckyung/AETTA.
format Preprint
id arxiv_https___arxiv_org_abs_2404_01351
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle AETTA: Label-Free Accuracy Estimation for Test-Time Adaptation
Lee, Taeckyung
Chottananurak, Sorn
Gong, Taesik
Lee, Sung-Ju
Machine Learning
Artificial Intelligence
Computer Vision and Pattern Recognition
Test-time adaptation (TTA) has emerged as a viable solution to adapt pre-trained models to domain shifts using unlabeled test data. However, TTA faces challenges of adaptation failures due to its reliance on blind adaptation to unknown test samples in dynamic scenarios. Traditional methods for out-of-distribution performance estimation are limited by unrealistic assumptions in the TTA context, such as requiring labeled data or re-training models. To address this issue, we propose AETTA, a label-free accuracy estimation algorithm for TTA. We propose the prediction disagreement as the accuracy estimate, calculated by comparing the target model prediction with dropout inferences. We then improve the prediction disagreement to extend the applicability of AETTA under adaptation failures. Our extensive evaluation with four baselines and six TTA methods demonstrates that AETTA shows an average of 19.8%p more accurate estimation compared with the baselines. We further demonstrate the effectiveness of accuracy estimation with a model recovery case study, showcasing the practicality of our model recovery based on accuracy estimation. The source code is available at https://github.com/taeckyung/AETTA.
title AETTA: Label-Free Accuracy Estimation for Test-Time Adaptation
topic Machine Learning
Artificial Intelligence
Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2404.01351