Frustration-induced quantum criticality in Ni-doped CePdAl as revealed by the $μ$SR technique

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ishant, I., Shiroka, T., Stockert, O., Fritsch, V., Majumder, M.
Format:	Preprint
Published:	2024
Subjects:	Strongly Correlated Electrons
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2404.01917