Non-Destructive, High-Resolution, Chemically Specific, 3D Nanostructure Characterization using Phase-Sensitive EUV Imaging Reflectometry

Fuente: arXiv
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Bibliographic Details
Main Authors: Tanksalvala, Michael, Porter, Christina L., Esashi, Yuka, Wang, Bin, Jenkins, Nicholas W., Zhang, Zhe, Miley, Galen P., Knobloch, Joshua L., McBennett, Brendan, Horiguchi, Naoto, Yazdi, Sadegh, Zhou, Jihan, Jacobs, Matthew N., Bevis, Charles S., Karl Jr., Robert M., Johnsen, Peter, Ren, David, Waller, Laura, Adams, Daniel E., Cousin, Seth L., Liao, Chen-Ting, Miao, Jianwei, Gerrity, Michael, Kapteyn, Henry C., Murnane, Margaret M.
Format: Preprint
Published: 2024
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