Non-Destructive, High-Resolution, Chemically Specific, 3D Nanostructure Characterization using Phase-Sensitive EUV Imaging Reflectometry
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arXiv
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| Main Authors: | Tanksalvala, Michael, Porter, Christina L., Esashi, Yuka, Wang, Bin, Jenkins, Nicholas W., Zhang, Zhe, Miley, Galen P., Knobloch, Joshua L., McBennett, Brendan, Horiguchi, Naoto, Yazdi, Sadegh, Zhou, Jihan, Jacobs, Matthew N., Bevis, Charles S., Karl Jr., Robert M., Johnsen, Peter, Ren, David, Waller, Laura, Adams, Daniel E., Cousin, Seth L., Liao, Chen-Ting, Miao, Jianwei, Gerrity, Michael, Kapteyn, Henry C., Murnane, Margaret M. |
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| Format: | Preprint |
| Published: |
2024
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