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Even-Odd Layer-Dependent Exchange Bias Effect in MnBi2Te4 Chern Insulator Devices

Fuente: arXiv

Guardado en:

Detalles Bibliográficos
Autores principales:	Chen, Bo, Liu, Xiaoda, Li, Yu-Hang, Tay, Han, Taniguchi, Takashi, Watanabe, Kenji, Chan, Moses. H. W., Yan, Jiaqiang, Song, Fengqi, Cheng, Ran, Chang, Cui-Zu
Formato:	Preprint
Publicado:	2024
Materias:	Materials Science Mesoscale and Nanoscale Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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