Test Time Training for Industrial Anomaly Segmentation
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arXiv
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| Main Authors: | , , , , , , |
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| Format: | Preprint |
| Published: |
2024
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| _version_ | 1866913300824981504 |
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| author | Costanzino, Alex Ramirez, Pierluigi Zama Del Moro, Mirko Aiezzo, Agostino Lisanti, Giuseppe Salti, Samuele Di Stefano, Luigi |
| author_facet | Costanzino, Alex Ramirez, Pierluigi Zama Del Moro, Mirko Aiezzo, Agostino Lisanti, Giuseppe Salti, Samuele Di Stefano, Luigi |
| contents | Anomaly Detection and Segmentation (AD&S) is crucial for industrial quality control. While existing methods excel in generating anomaly scores for each pixel, practical applications require producing a binary segmentation to identify anomalies. Due to the absence of labeled anomalies in many real scenarios, standard practices binarize these maps based on some statistics derived from a validation set containing only nominal samples, resulting in poor segmentation performance. This paper addresses this problem by proposing a test time training strategy to improve the segmentation performance. Indeed, at test time, we can extract rich features directly from anomalous samples to train a classifier that can discriminate defects effectively. Our general approach can work downstream to any AD&S method that provides an anomaly score map as output, even in multimodal settings. We demonstrate the effectiveness of our approach over baselines through extensive experimentation and evaluation on MVTec AD and MVTec 3D-AD. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2404_03743 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Test Time Training for Industrial Anomaly Segmentation Costanzino, Alex Ramirez, Pierluigi Zama Del Moro, Mirko Aiezzo, Agostino Lisanti, Giuseppe Salti, Samuele Di Stefano, Luigi Computer Vision and Pattern Recognition Anomaly Detection and Segmentation (AD&S) is crucial for industrial quality control. While existing methods excel in generating anomaly scores for each pixel, practical applications require producing a binary segmentation to identify anomalies. Due to the absence of labeled anomalies in many real scenarios, standard practices binarize these maps based on some statistics derived from a validation set containing only nominal samples, resulting in poor segmentation performance. This paper addresses this problem by proposing a test time training strategy to improve the segmentation performance. Indeed, at test time, we can extract rich features directly from anomalous samples to train a classifier that can discriminate defects effectively. Our general approach can work downstream to any AD&S method that provides an anomaly score map as output, even in multimodal settings. We demonstrate the effectiveness of our approach over baselines through extensive experimentation and evaluation on MVTec AD and MVTec 3D-AD. |
| title | Test Time Training for Industrial Anomaly Segmentation |
| topic | Computer Vision and Pattern Recognition |
| url | https://arxiv.org/abs/2404.03743 |