Self-referencing photothermal common-path interferometry to measure absorption of Si3N4 membranes for laser-light sails

Fuente: arXiv
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Main Authors: Kumar, Tanuj, Feng, Demeng, Yin, Shenwei, Mah, Merlin, Lin, Phyo, Fortman, Margaret, Jaffe, Gabriel R., Wan, Chenghao, Mei, Hongyan, Xiao, Yuzhe, Synowicki, Ron, Warzoha, Ronald J., Brar, Victor W., Talghader, Joseph J., Kats, Mikhail A.
Format: Preprint
Published: 2024
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author Kumar, Tanuj
Feng, Demeng
Yin, Shenwei
Mah, Merlin
Lin, Phyo
Fortman, Margaret
Jaffe, Gabriel R.
Wan, Chenghao
Mei, Hongyan
Xiao, Yuzhe
Synowicki, Ron
Warzoha, Ronald J.
Brar, Victor W.
Talghader, Joseph J.
Kats, Mikhail A.
author_facet Kumar, Tanuj
Feng, Demeng
Yin, Shenwei
Mah, Merlin
Lin, Phyo
Fortman, Margaret
Jaffe, Gabriel R.
Wan, Chenghao
Mei, Hongyan
Xiao, Yuzhe
Synowicki, Ron
Warzoha, Ronald J.
Brar, Victor W.
Talghader, Joseph J.
Kats, Mikhail A.
contents Laser-light sails are a spacecraft concept wherein lightweight "sails" are propelled by high-intensity lasers. We investigated the near-infrared absorption of free-standing membranes of stoichiometric silicon nitride (Si$_3$N$_4$), a candidate sail material. To resolve the small but non-zero optical loss, we used photothermal common-path interferometry (PCI), for which we developed a self-referencing modality where a PCI measurement is performed twice: once on a bare membrane, and a second time with monolayer graphene deposited on the membrane. The graphene increases the absorption of the sample by orders of magnitude, such that it can be measured by ellipsometry, without significantly affecting the thermal properties. We measured the absorption coefficient of Si$_3$N$_4$ to be (1.5-3) $\times$ 10$^{-2}$ cm$^{-1}$ at 1064 nm, making it a suitable sail material for laser intensities as high as ~10 GW/m$^2$. By comparison, silicon-rich "low stress" SiN$_x$ (x~1), with a measured absorption coefficient of approximately 8 cm$^{-1}$, is unlikely to survive such high laser intensities. Our self-referencing technique enables testing of low-loss membranes of various materials for laser sails and other applications.
format Preprint
id arxiv_https___arxiv_org_abs_2404_04449
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Self-referencing photothermal common-path interferometry to measure absorption of Si3N4 membranes for laser-light sails
Kumar, Tanuj
Feng, Demeng
Yin, Shenwei
Mah, Merlin
Lin, Phyo
Fortman, Margaret
Jaffe, Gabriel R.
Wan, Chenghao
Mei, Hongyan
Xiao, Yuzhe
Synowicki, Ron
Warzoha, Ronald J.
Brar, Victor W.
Talghader, Joseph J.
Kats, Mikhail A.
Optics
Materials Science
Applied Physics
Space Physics
Laser-light sails are a spacecraft concept wherein lightweight "sails" are propelled by high-intensity lasers. We investigated the near-infrared absorption of free-standing membranes of stoichiometric silicon nitride (Si$_3$N$_4$), a candidate sail material. To resolve the small but non-zero optical loss, we used photothermal common-path interferometry (PCI), for which we developed a self-referencing modality where a PCI measurement is performed twice: once on a bare membrane, and a second time with monolayer graphene deposited on the membrane. The graphene increases the absorption of the sample by orders of magnitude, such that it can be measured by ellipsometry, without significantly affecting the thermal properties. We measured the absorption coefficient of Si$_3$N$_4$ to be (1.5-3) $\times$ 10$^{-2}$ cm$^{-1}$ at 1064 nm, making it a suitable sail material for laser intensities as high as ~10 GW/m$^2$. By comparison, silicon-rich "low stress" SiN$_x$ (x~1), with a measured absorption coefficient of approximately 8 cm$^{-1}$, is unlikely to survive such high laser intensities. Our self-referencing technique enables testing of low-loss membranes of various materials for laser sails and other applications.
title Self-referencing photothermal common-path interferometry to measure absorption of Si3N4 membranes for laser-light sails
topic Optics
Materials Science
Applied Physics
Space Physics
url https://arxiv.org/abs/2404.04449