APA (7th ed.) Citation

Boivin, D., Jean-Marie-Désirée, R., Najah, A., Cuynet, S., & de Poucques, L. (2024). Using a coupled optical and electrical monitoring method to follow the R-HiPIMS TiO$_2$ deposition process drifts.

Chicago Style (17th ed.) Citation

Boivin, D., R. Jean-Marie-Désirée, A. Najah, S. Cuynet, and L. de Poucques. Using a Coupled Optical and Electrical Monitoring Method to Follow the R-HiPIMS TiO$_2$ Deposition Process Drifts. 2024.

MLA (9th ed.) Citation

Boivin, D., et al. Using a Coupled Optical and Electrical Monitoring Method to Follow the R-HiPIMS TiO$_2$ Deposition Process Drifts. 2024.