Using a coupled optical and electrical monitoring method to follow the R-HiPIMS TiO$_2$ deposition process drifts

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Boivin, D, Jean-Marie-Désirée, R, Najah, A, Cuynet, S, de Poucques, L
Format: Preprint
Published: 2024
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866914745934675968
author Boivin, D
Jean-Marie-Désirée, R
Najah, A
Cuynet, S
de Poucques, L
author_facet Boivin, D
Jean-Marie-Désirée, R
Najah, A
Cuynet, S
de Poucques, L
contents In this work, coupled optical and electrical discharge measurements have been implemented to investigate the plasma state of a reactive HiPIMS TiO$_2$ deposition process running at a fixed duty cycle of 2% and at a repetition rate of 1 kHz. Investigations focus on both the effect of the erosion target and substrate-holder temperature in an Ar/O$_2$ gas mixture at fixed working pressure. First, as the racetrack shape evolves with the use of the target, the deposition rate is modified, in the same way as the emission intensity measured. Second, with the heater set at 400 $^\circ$C in pure Ar, the coating appears thinner, and the optical emission spectroscopy measurement reveals the presence of oxygen atoms. Thus, the results from the coupled optical and electrical measurements are sensitive enough to track potential drift of the process.
format Preprint
id arxiv_https___arxiv_org_abs_2404_06084
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Using a coupled optical and electrical monitoring method to follow the R-HiPIMS TiO$_2$ deposition process drifts
Boivin, D
Jean-Marie-Désirée, R
Najah, A
Cuynet, S
de Poucques, L
Plasma Physics
In this work, coupled optical and electrical discharge measurements have been implemented to investigate the plasma state of a reactive HiPIMS TiO$_2$ deposition process running at a fixed duty cycle of 2% and at a repetition rate of 1 kHz. Investigations focus on both the effect of the erosion target and substrate-holder temperature in an Ar/O$_2$ gas mixture at fixed working pressure. First, as the racetrack shape evolves with the use of the target, the deposition rate is modified, in the same way as the emission intensity measured. Second, with the heater set at 400 $^\circ$C in pure Ar, the coating appears thinner, and the optical emission spectroscopy measurement reveals the presence of oxygen atoms. Thus, the results from the coupled optical and electrical measurements are sensitive enough to track potential drift of the process.
title Using a coupled optical and electrical monitoring method to follow the R-HiPIMS TiO$_2$ deposition process drifts
topic Plasma Physics
url https://arxiv.org/abs/2404.06084