Precision measurements on Si-

Fuente: arXiv

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Bibliographic Details
Main Authors:	Karls, J., Cederquist, H., Gibson, N. D., Grumer, J., Ji, M., Kardasch, I., Leimbach, D., Martini, P., Navarrete, J. E. Navarro, Poulose, R., Rosen, S., Schmidt, H. T., Simonsson, A., Zettergren, H., Hanstorp, D.
Format:	Preprint
Published:	2024
Subjects:	Atomic Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2404.06226