Precision measurements on Si-

Fuente: arXiv
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Main Authors: Karls, J., Cederquist, H., Gibson, N. D., Grumer, J., Ji, M., Kardasch, I., Leimbach, D., Martini, P., Navarrete, J. E. Navarro, Poulose, R., Rosen, S., Schmidt, H. T., Simonsson, A., Zettergren, H., Hanstorp, D.
Format: Preprint
Published: 2024
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author Karls, J.
Cederquist, H.
Gibson, N. D.
Grumer, J.
Ji, M.
Kardasch, I.
Leimbach, D.
Martini, P.
Navarrete, J. E. Navarro
Poulose, R.
Rosen, S.
Schmidt, H. T.
Simonsson, A.
Zettergren, H.
Hanstorp, D.
author_facet Karls, J.
Cederquist, H.
Gibson, N. D.
Grumer, J.
Ji, M.
Kardasch, I.
Leimbach, D.
Martini, P.
Navarrete, J. E. Navarro
Poulose, R.
Rosen, S.
Schmidt, H. T.
Simonsson, A.
Zettergren, H.
Hanstorp, D.
contents High-precision measurements of the electron affinities (EA) of the three stable isotopes of silicon, $^{28}$Si, $^{29}$Si and $^{30}$Si, have been performed at the cryogenic electrostatic ion-beam storage ring DESIREE. The quantum states of the ions were manipulated using laser depletion, and the ions were photodetached by laser photodetachment threshold spectroscopy. These EA values are the first reported for $^{29}$Si$^-$ and $^{30}$Si$^-$ and provide a reduced uncertainty for $^{28}$Si$^-$. The resulting EAs are $EA(^{28}$Si$) = 1.38952201(17)$ eV, $EA(^{29}$Si$) = 1.38952172(12)$ eV and $EA(^{29}$Si$) = 1.38952078(12)$ eV, with the corresponding isotope shifts $IS(^{29-28}$Si$) = 0.29(16)$ micro eV and $IS(^{30-28}$Si$) = 1.23(16) $ micro eV. In addition to these measurements, the resolution and signal-to-background level was sufficient to reveal the hyperfine structure splitting in the $^{29}$Si$^-$ isotope, which we report to be $1.8(4) micro eV.
format Preprint
id arxiv_https___arxiv_org_abs_2404_06226
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Precision measurements on Si-
Karls, J.
Cederquist, H.
Gibson, N. D.
Grumer, J.
Ji, M.
Kardasch, I.
Leimbach, D.
Martini, P.
Navarrete, J. E. Navarro
Poulose, R.
Rosen, S.
Schmidt, H. T.
Simonsson, A.
Zettergren, H.
Hanstorp, D.
Atomic Physics
High-precision measurements of the electron affinities (EA) of the three stable isotopes of silicon, $^{28}$Si, $^{29}$Si and $^{30}$Si, have been performed at the cryogenic electrostatic ion-beam storage ring DESIREE. The quantum states of the ions were manipulated using laser depletion, and the ions were photodetached by laser photodetachment threshold spectroscopy. These EA values are the first reported for $^{29}$Si$^-$ and $^{30}$Si$^-$ and provide a reduced uncertainty for $^{28}$Si$^-$. The resulting EAs are $EA(^{28}$Si$) = 1.38952201(17)$ eV, $EA(^{29}$Si$) = 1.38952172(12)$ eV and $EA(^{29}$Si$) = 1.38952078(12)$ eV, with the corresponding isotope shifts $IS(^{29-28}$Si$) = 0.29(16)$ micro eV and $IS(^{30-28}$Si$) = 1.23(16) $ micro eV. In addition to these measurements, the resolution and signal-to-background level was sufficient to reveal the hyperfine structure splitting in the $^{29}$Si$^-$ isotope, which we report to be $1.8(4) micro eV.
title Precision measurements on Si-
topic Atomic Physics
url https://arxiv.org/abs/2404.06226