Cita APA (7a ed.)

Hockings, E. T., Doherty, A. C., & Harper, R. (2024). Scalable noise characterization of syndrome-extraction circuits with averaged circuit eigenvalue sampling.

Cita Chicago Style (17a ed.)

Hockings, Evan T., Andrew C. Doherty, y Robin Harper. Scalable Noise Characterization of Syndrome-extraction Circuits with Averaged Circuit Eigenvalue Sampling. 2024.

Cita MLA (9a ed.)

Hockings, Evan T., et al. Scalable Noise Characterization of Syndrome-extraction Circuits with Averaged Circuit Eigenvalue Sampling. 2024.