Contrastive-Based Deep Embeddings for Label Noise-Resilient Histopathology Image Classification

Fuente: arXiv

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Bibliographic Details
Main Authors:	Dedieu, Lucas, Nerrienet, Nicolas, Nivaggioli, Adrien, Simmat, Clara, Clavel, Marceau, Gauthier, Arnaud, Sockeel, Stéphane, Peyret, Rémy
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2404.07605