Photoluminescence of Femtosecond Laser-irradiated Silicon Carbide
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arXiv
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| Autori principali: | , , , , , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2024
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| _version_ | 1866918415492448256 |
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| author | Abdedou, Y. Fuchs, A. Fuchs, P. Heiler, J. Herrmann, D. Weber, S. Schäfer, M. L'huillier, J. Kaiser, F. Becher, C. Neu, E. |
| author_facet | Abdedou, Y. Fuchs, A. Fuchs, P. Heiler, J. Herrmann, D. Weber, S. Schäfer, M. L'huillier, J. Kaiser, F. Becher, C. Neu, E. |
| contents | Silicon carbide (SiC) is the leading wide-bandgap semiconductor material, providing mature doping and device fabrication. Additionally, SiC hosts a multitude of optically active point defects (color centers) and is relevant for many applications in quantum technologies. A crucial step towards harnessing the full potential of the SiC platform includes technologies to create color centers with defined localization and density, e.g. to facilitate their coupling to nano-photonic structures and to observe cooperative effects. Here, silicon vacancy centers and divacancies stand out as no impurity atom is needed and high-thermal budget annealing steps can be avoided. We characterize the effect of localized, femtosecond laser irradiation of SiC, investigating surface modifications and photoluminescence including Raman spectroscopy and optical lifetime measurements. We employ commercial high-purity, semi-insulating substrates and an industrial grade laser system to explore broader applicability of the method. As a novel approach, we apply femtosecond laser irradiation to SiC substrates with an epitaxial graphene layer and find that the threshold for photoluminescence due to laser treatment is lowered. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2404_09906 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Photoluminescence of Femtosecond Laser-irradiated Silicon Carbide Abdedou, Y. Fuchs, A. Fuchs, P. Heiler, J. Herrmann, D. Weber, S. Schäfer, M. L'huillier, J. Kaiser, F. Becher, C. Neu, E. Materials Science Optics Silicon carbide (SiC) is the leading wide-bandgap semiconductor material, providing mature doping and device fabrication. Additionally, SiC hosts a multitude of optically active point defects (color centers) and is relevant for many applications in quantum technologies. A crucial step towards harnessing the full potential of the SiC platform includes technologies to create color centers with defined localization and density, e.g. to facilitate their coupling to nano-photonic structures and to observe cooperative effects. Here, silicon vacancy centers and divacancies stand out as no impurity atom is needed and high-thermal budget annealing steps can be avoided. We characterize the effect of localized, femtosecond laser irradiation of SiC, investigating surface modifications and photoluminescence including Raman spectroscopy and optical lifetime measurements. We employ commercial high-purity, semi-insulating substrates and an industrial grade laser system to explore broader applicability of the method. As a novel approach, we apply femtosecond laser irradiation to SiC substrates with an epitaxial graphene layer and find that the threshold for photoluminescence due to laser treatment is lowered. |
| title | Photoluminescence of Femtosecond Laser-irradiated Silicon Carbide |
| topic | Materials Science Optics |
| url | https://arxiv.org/abs/2404.09906 |