APA (7th ed.) Citation

Diao, Z., Ueda, K., Hou, L., Li, F., Yamashita, H., & Abe, M. (2024). AI-equipped scanning probe microscopy for autonomous site-specific atomic-level characterization at room temperature.

Chicago Style (17th ed.) Citation

Diao, Zhuo, Keiichi Ueda, Linfeng Hou, Fengxuan Li, Hayato Yamashita, and Masayuki Abe. AI-equipped Scanning Probe Microscopy for Autonomous Site-specific Atomic-level Characterization at Room Temperature. 2024.

MLA (9th ed.) Citation

Diao, Zhuo, et al. AI-equipped Scanning Probe Microscopy for Autonomous Site-specific Atomic-level Characterization at Room Temperature. 2024.