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Method for efficient large-scale cryogenic characterization of CMOS technologies

Fuente: arXiv

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Bibliographic Details
Main Authors:	Eastoe, Jonathan, Noah, Grayson M., Dutta, Debargha, Rossi, Alessandro, Fletcher, Jonathan D., Gomez-Saiz, Alberto
Format:	Preprint
Published:	2024
Subjects:	Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
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