Microwave dependent quantum transport characteristics in GaN/AlGaN FETs

Fuente: arXiv
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Bibliographic Details
Main Authors: Shinozaki, Motoya, Abe, Takaya, Matsumura, Kazuma, Aizawa, Takumi, Kumasaka, Takashi, Otsuka, Tomohiro
Format: Preprint
Published: 2024
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author Shinozaki, Motoya
Abe, Takaya
Matsumura, Kazuma
Aizawa, Takumi
Kumasaka, Takashi
Otsuka, Tomohiro
author_facet Shinozaki, Motoya
Abe, Takaya
Matsumura, Kazuma
Aizawa, Takumi
Kumasaka, Takashi
Otsuka, Tomohiro
contents Defects in semiconductors, traditionally seen as detrimental to electronic device performance, have emerged as potential assets in quantum technologies due to their unique quantum properties. This study investigates the interaction between defects and quantum electron transport in GaN/AlGaN field-effect transistors, highlighting the observation of Fano resonances at low temperatures. We observe the resonance spectra and their dependence on gate voltage and magnetic fields. To explain the observed behavior, we construct the possible scenario as a Fano interferometer with finite width. Our findings reveal the potential of semiconductor defects to contribute to the development of quantum information processing, providing their role to key components in next-generation quantum devices.
format Preprint
id arxiv_https___arxiv_org_abs_2404_11756
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Microwave dependent quantum transport characteristics in GaN/AlGaN FETs
Shinozaki, Motoya
Abe, Takaya
Matsumura, Kazuma
Aizawa, Takumi
Kumasaka, Takashi
Otsuka, Tomohiro
Mesoscale and Nanoscale Physics
Defects in semiconductors, traditionally seen as detrimental to electronic device performance, have emerged as potential assets in quantum technologies due to their unique quantum properties. This study investigates the interaction between defects and quantum electron transport in GaN/AlGaN field-effect transistors, highlighting the observation of Fano resonances at low temperatures. We observe the resonance spectra and their dependence on gate voltage and magnetic fields. To explain the observed behavior, we construct the possible scenario as a Fano interferometer with finite width. Our findings reveal the potential of semiconductor defects to contribute to the development of quantum information processing, providing their role to key components in next-generation quantum devices.
title Microwave dependent quantum transport characteristics in GaN/AlGaN FETs
topic Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2404.11756