AutoInspect: Towards Long-Term Autonomous Industrial Inspection

Fuente: arXiv
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Bibliographic Details
Main Authors: Staniaszek, Michal, Flatscher, Tobit, Rowell, Joseph, Niu, Hanlin, Liu, Wenxing, You, Yang, Skilton, Robert, Fallon, Maurice, Hawes, Nick
Format: Preprint
Published: 2024
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