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Bibliographic Details
Main Authors: Orozco-Ruiz, Modesto, Rehman, Wasim, Mintert, Florian
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2404.12961
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Table of Contents:
  • We present an entangling gate scheme for trapped-ion chains that achieves high-fidelity operations with excited motional states despite multiple error sources. Our approach incorporates all relevant motional modes and exhibits enhanced robustness against both motional heating effects and detuning errors, critical features for building robust and scalable trapped-ion quantum computers.