An Alternative Method to Identify the Susceptibility Threshold Level of Device under Test in a Reverberation Chamber
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arXiv
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| Main Authors: | , , , , , |
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| Format: | Preprint |
| Published: |
2024
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| _version_ | 1866911850632839168 |
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| author | Xu, Qian Chen, Kai Shen, Xueqi Xing, Lei Huang, Yi Loh, Tian Hong |
| author_facet | Xu, Qian Chen, Kai Shen, Xueqi Xing, Lei Huang, Yi Loh, Tian Hong |
| contents | By counting the number of pass/fail occurrences of a DUT (Device under Test) in the stirring process in a reverberation chamber (RC), the threshold electric field (E-field) level can be well estimated without tuning the input power and repeating the whole testing many times. The Monte-Carlo method is used to verify the results. Estimated values and uncertainties are given for Rayleigh distributed fields and for Rice distributed fields with different K-factors. |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2404_15262 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | An Alternative Method to Identify the Susceptibility Threshold Level of Device under Test in a Reverberation Chamber Xu, Qian Chen, Kai Shen, Xueqi Xing, Lei Huang, Yi Loh, Tian Hong Signal Processing Systems and Control By counting the number of pass/fail occurrences of a DUT (Device under Test) in the stirring process in a reverberation chamber (RC), the threshold electric field (E-field) level can be well estimated without tuning the input power and repeating the whole testing many times. The Monte-Carlo method is used to verify the results. Estimated values and uncertainties are given for Rayleigh distributed fields and for Rice distributed fields with different K-factors. |
| title | An Alternative Method to Identify the Susceptibility Threshold Level of Device under Test in a Reverberation Chamber |
| topic | Signal Processing Systems and Control |
| url | https://arxiv.org/abs/2404.15262 |