Fusing Pretrained ViTs with TCNet for Enhanced EEG Regression

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Hauptverfasser: Modesitt, Eric, Yin, Haicheng, Wang, Williams Huang, Lu, Brian
Format: Preprint
Veröffentlicht: 2024
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author Modesitt, Eric
Yin, Haicheng
Wang, Williams Huang
Lu, Brian
author_facet Modesitt, Eric
Yin, Haicheng
Wang, Williams Huang
Lu, Brian
contents The task of Electroencephalogram (EEG) analysis is paramount to the development of Brain-Computer Interfaces (BCIs). However, to reach the goal of developing robust, useful BCIs depends heavily on the speed and the accuracy at which BCIs can understand neural dynamics. In response to that goal, this paper details the integration of pre-trained Vision Transformers (ViTs) with Temporal Convolutional Networks (TCNet) to enhance the precision of EEG regression. The core of this approach lies in harnessing the sequential data processing strengths of ViTs along with the superior feature extraction capabilities of TCNet, to significantly improve EEG analysis accuracy. In addition, we analyze the importance of how to construct optimal patches for the attention mechanism to analyze, balancing both speed and accuracy tradeoffs. Our results showcase a substantial improvement in regression accuracy, as evidenced by the reduction of Root Mean Square Error (RMSE) from 55.4 to 51.8 on EEGEyeNet's Absolute Position Task, outperforming existing state-of-the-art models. Without sacrificing performance, we increase the speed of this model by an order of magnitude (up to 4.32x faster). This breakthrough not only sets a new benchmark in EEG regression analysis but also opens new avenues for future research in the integration of transformer architectures with specialized feature extraction methods for diverse EEG datasets.
format Preprint
id arxiv_https___arxiv_org_abs_2404_15311
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Fusing Pretrained ViTs with TCNet for Enhanced EEG Regression
Modesitt, Eric
Yin, Haicheng
Wang, Williams Huang
Lu, Brian
Signal Processing
Artificial Intelligence
Machine Learning
The task of Electroencephalogram (EEG) analysis is paramount to the development of Brain-Computer Interfaces (BCIs). However, to reach the goal of developing robust, useful BCIs depends heavily on the speed and the accuracy at which BCIs can understand neural dynamics. In response to that goal, this paper details the integration of pre-trained Vision Transformers (ViTs) with Temporal Convolutional Networks (TCNet) to enhance the precision of EEG regression. The core of this approach lies in harnessing the sequential data processing strengths of ViTs along with the superior feature extraction capabilities of TCNet, to significantly improve EEG analysis accuracy. In addition, we analyze the importance of how to construct optimal patches for the attention mechanism to analyze, balancing both speed and accuracy tradeoffs. Our results showcase a substantial improvement in regression accuracy, as evidenced by the reduction of Root Mean Square Error (RMSE) from 55.4 to 51.8 on EEGEyeNet's Absolute Position Task, outperforming existing state-of-the-art models. Without sacrificing performance, we increase the speed of this model by an order of magnitude (up to 4.32x faster). This breakthrough not only sets a new benchmark in EEG regression analysis but also opens new avenues for future research in the integration of transformer architectures with specialized feature extraction methods for diverse EEG datasets.
title Fusing Pretrained ViTs with TCNet for Enhanced EEG Regression
topic Signal Processing
Artificial Intelligence
Machine Learning
url https://arxiv.org/abs/2404.15311