Sum of Group Error Differences: A Critical Examination of Bias Evaluation in Biometric Verification and a Dual-Metric Measure

Fuente: arXiv

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Bibliographic Details
Main Authors:	Elobaid, Alaa, Ramoly, Nathan, Younes, Lara, Papadopoulos, Symeon, Ntoutsi, Eirini, Kompatsiaris, Ioannis
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence Computers and Society
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2404.15385