APA (7th ed.) Citation

Pleli, A., Baeuerle, S., Janus, M., Barth, J., Mikut, R., & Lensch, H. P. A. (2024). Iterative Cluster Harvesting for Wafer Map Defect Patterns.

Chicago Style (17th ed.) Citation

Pleli, Alina, Simon Baeuerle, Michel Janus, Jonas Barth, Ralf Mikut, and Hendrik P. A. Lensch. Iterative Cluster Harvesting for Wafer Map Defect Patterns. 2024.

MLA (9th ed.) Citation

Pleli, Alina, et al. Iterative Cluster Harvesting for Wafer Map Defect Patterns. 2024.