Citazione Stile APA (7a Edizione)

Pleli, A., Baeuerle, S., Janus, M., Barth, J., Mikut, R., & Lensch, H. P. A. (2024). Iterative Cluster Harvesting for Wafer Map Defect Patterns.

Citazione stile Chigago Style (17a edizione)

Pleli, Alina, Simon Baeuerle, Michel Janus, Jonas Barth, Ralf Mikut, e Hendrik P. A. Lensch. Iterative Cluster Harvesting for Wafer Map Defect Patterns. 2024.

Citatione MLA (9a ed.)

Pleli, Alina, et al. Iterative Cluster Harvesting for Wafer Map Defect Patterns. 2024.