Enhancing Diagnosis through AI-driven Analysis of Reflectance Confocal Microscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yoon, Hong-Jun, Keum, Chris, Witkowski, Alexander, Ludzik, Joanna, Petrie, Tracy, Hanson, Heidi A., Leachman, Sancy A.
Format:	Preprint
Published:	2024
Subjects:	Image and Video Processing Artificial Intelligence Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2404.16080