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Enhancing Diagnosis through AI-driven Analysis of Reflectance Confocal Microscopy

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Yoon, Hong-Jun, Keum, Chris, Witkowski, Alexander, Ludzik, Joanna, Petrie, Tracy, Hanson, Heidi A., Leachman, Sancy A.
Formato:	Preprint
Publicado:	2024
Materias:	Image and Video Processing Artificial Intelligence Computer Vision and Pattern Recognition
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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