3D deep learning for enhanced atom probe tomography analysis of nanoscale microstructures

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yu, Jiwei, Wang, Zhangwei, Saksena, Aparna, Wei, Shaolou, Wei, Ye, Colnaghi, Timoteo, Marek, Andreas, Rampp, Markus, Song, Min, Gault, Baptiste, Li, Yue
Format:	Preprint
Published:	2024
Subjects:	Materials Science Data Analysis, Statistics and Probability
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2404.16524