Faucher, N., & Blanton, M. R. (2024). Testing the accuracy of SED modeling techniques using the NIHAO-SKIRT-Catalog.
Cita Chicago Style (17a ed.)Faucher, Nicholas, y Michael R. Blanton. Testing the Accuracy of SED Modeling Techniques Using the NIHAO-SKIRT-Catalog. 2024.
Cita MLA (9a ed.)Faucher, Nicholas, y Michael R. Blanton. Testing the Accuracy of SED Modeling Techniques Using the NIHAO-SKIRT-Catalog. 2024.
Precaución: Estas citas no son 100% exactas.