Faucher, N., & Blanton, M. R. (2024). Testing the accuracy of SED modeling techniques using the NIHAO-SKIRT-Catalog.
Chicago Style (17th ed.) CitationFaucher, Nicholas, and Michael R. Blanton. Testing the Accuracy of SED Modeling Techniques Using the NIHAO-SKIRT-Catalog. 2024.
MLA (9th ed.) CitationFaucher, Nicholas, and Michael R. Blanton. Testing the Accuracy of SED Modeling Techniques Using the NIHAO-SKIRT-Catalog. 2024.
Warning: These citations may not always be 100% accurate.