Gao, Z., Xue, Z., Hu, X., Shang, W., & Xia, X. (2024). Easy over Hard: A Simple Baseline for Test Failures Causes Prediction.
Cita Chicago Style (17a ed.)Gao, Zhipeng, Zhipeng Xue, Xing Hu, Weiyi Shang, y Xin Xia. Easy over Hard: A Simple Baseline for Test Failures Causes Prediction. 2024.
Cita MLA (9a ed.)Gao, Zhipeng, et al. Easy over Hard: A Simple Baseline for Test Failures Causes Prediction. 2024.
Precaución: Estas citas no son 100% exactas.