A View on Out-of-Distribution Identification from a Statistical Testing Theory Perspective

Fuente: arXiv

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Bibliographic Details
Main Authors:	Caron, Alberto, Hicks, Chris, Mavroudis, Vasilios
Format:	Preprint
Published:	2024
Subjects:	Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2405.03052