Towards Utilizing Scanning Gate Microscopy as a High-Resolution Probe of Valley Splitting in Si/SiGe Heterostructures

Fuente: arXiv

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Bibliographic Details
Main Authors:	Cakar, Efe, Ercan, H. Ekmel, Fuchs, Gordian, Denisov, Artem O., Anderson, Christopher R., Gyure, Mark F., Petta, Jason R.
Format:	Preprint
Published:	2024
Subjects:	Mesoscale and Nanoscale Physics Quantum Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2405.03596