Cita APA (7a ed.)

Baek, C., Kolter, Z., & Raghunathan, A. (2024). Why is SAM Robust to Label Noise?

Cita Chicago Style (17a ed.)

Baek, Christina, Zico Kolter, y Aditi Raghunathan. Why Is SAM Robust to Label Noise? 2024.

Cita MLA (9a ed.)

Baek, Christina, et al. Why Is SAM Robust to Label Noise? 2024.

Precaución: Estas citas no son 100% exactas.