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Supervised Anomaly Detection for Complex Industrial Images

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Baitieva, Aimira, Hurych, David, Besnier, Victor, Bernard, Olivier
Natura:	Preprint
Pubblicazione:	2024
Soggetti:	Computer Vision and Pattern Recognition Machine Learning
Accesso online:	Acceder al recurso
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