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Main Authors: Wang, Qian, Zhang, Na, Yu, Hongyi
Format: Preprint
Published: 2024
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Online Access:https://arxiv.org/abs/2405.06555
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_version_ 1866929529828671488
author Wang, Qian
Zhang, Na
Yu, Hongyi
author_facet Wang, Qian
Zhang, Na
Yu, Hongyi
contents We investigated the interlayer coupling effect in homobilayer structures of MSi2X4 with M = Mo/W and X = N/P/As. Through the combination of first-principles calculations and analytical formulations, the equilibrium interlayer distance, layer energy difference and interlayer hopping strength are obtained for all six MSi2X4 materials, which are found to be insensitive to the type of M atom but differ significantly between X = N and X = P/As. In homobilayers with close to 0° twist angles, the interlayer charge redistribution introduces a stacking-dependent interlayer electrostatic potential with a magnitude reaching 0.1 eV in MSi2N4, suggesting that it can be an excellent candidate for studying the sliding ferroelectricity. The interlayer hopping strengths are found to be as large as several tens meV at valence band maxima positions K and Γ, and ~ 1 meV at the conduction band edge K. The resultant layer-hybridizations vary in a large range under different stacking registries, which can be used to simulate honeycomb lattice models with both trivial and non-trivial band topologies.
format Preprint
id arxiv_https___arxiv_org_abs_2405_06555
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Interlayer couplings in homobilayer structures of MSi2X4 (M = Mo/W, X = N/P/As)
Wang, Qian
Zhang, Na
Yu, Hongyi
Materials Science
Mesoscale and Nanoscale Physics
We investigated the interlayer coupling effect in homobilayer structures of MSi2X4 with M = Mo/W and X = N/P/As. Through the combination of first-principles calculations and analytical formulations, the equilibrium interlayer distance, layer energy difference and interlayer hopping strength are obtained for all six MSi2X4 materials, which are found to be insensitive to the type of M atom but differ significantly between X = N and X = P/As. In homobilayers with close to 0° twist angles, the interlayer charge redistribution introduces a stacking-dependent interlayer electrostatic potential with a magnitude reaching 0.1 eV in MSi2N4, suggesting that it can be an excellent candidate for studying the sliding ferroelectricity. The interlayer hopping strengths are found to be as large as several tens meV at valence band maxima positions K and Γ, and ~ 1 meV at the conduction band edge K. The resultant layer-hybridizations vary in a large range under different stacking registries, which can be used to simulate honeycomb lattice models with both trivial and non-trivial band topologies.
title Interlayer couplings in homobilayer structures of MSi2X4 (M = Mo/W, X = N/P/As)
topic Materials Science
Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2405.06555