Fine residual stress distribution measurement of steel materials by SOI pixel detector with synchrotron X-rays

Fuente: arXiv
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Bibliographic Details
Main Authors: Nishimura, Ryutaro, Kishimoto, Shunji, Sasaki, Toshihiko, Mitsui, Shingo, Shinya, Masayoshi, Arai, Yasuo, Miyoshi, Toshinobu
Format: Preprint
Published: 2024
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