Application of Probabilistic-bit in Precision Measurements
Fuente:
arXiv
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| Autori principali: | , |
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| Natura: | Preprint |
| Pubblicazione: |
2024
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| _version_ | 1866916884475019264 |
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| author | Liu, Yunwen Xiao, Jiang |
| author_facet | Liu, Yunwen Xiao, Jiang |
| contents | We propose a novel approach for precision measurement utilizing an ensemble of probabilistic bits (p-bits). This method leverages the inherent fluctuations of p-bits to achieve high sensitivity in various applications, including magnetic field sensing, temperature monitoring and timekeeping. The sensitivity scales proportionally to the square root of the total number of p-bits, enabling unprecedented accuracy with large ensembles. Furthermore, the robustness of this method against device imperfections and non-uniformity enhances its practicality and scalability. This work paves the way for a new paradigm in precision measurement, offering a cost-effective and versatile alternative to traditional methods. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2405_08382 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Application of Probabilistic-bit in Precision Measurements Liu, Yunwen Xiao, Jiang Applied Physics Mesoscale and Nanoscale Physics Statistical Mechanics We propose a novel approach for precision measurement utilizing an ensemble of probabilistic bits (p-bits). This method leverages the inherent fluctuations of p-bits to achieve high sensitivity in various applications, including magnetic field sensing, temperature monitoring and timekeeping. The sensitivity scales proportionally to the square root of the total number of p-bits, enabling unprecedented accuracy with large ensembles. Furthermore, the robustness of this method against device imperfections and non-uniformity enhances its practicality and scalability. This work paves the way for a new paradigm in precision measurement, offering a cost-effective and versatile alternative to traditional methods. |
| title | Application of Probabilistic-bit in Precision Measurements |
| topic | Applied Physics Mesoscale and Nanoscale Physics Statistical Mechanics |
| url | https://arxiv.org/abs/2405.08382 |