APA (7th ed.) Citation

Wagner, T., Çelik, H., Berger, D., Häusler, I., & Lehmann, M. (2024). Imaging Localized Variable Capacitance During Switching Processes in Silicon Diodes by Time-Resolved Electron Holography.

Chicago Style (17th ed.) Citation

Wagner, Tolga, Hüseyin Çelik, Dirk Berger, Ines Häusler, and Michael Lehmann. Imaging Localized Variable Capacitance During Switching Processes in Silicon Diodes by Time-Resolved Electron Holography. 2024.

MLA (9th ed.) Citation

Wagner, Tolga, et al. Imaging Localized Variable Capacitance During Switching Processes in Silicon Diodes by Time-Resolved Electron Holography. 2024.