Wagner, T., Çelik, H., Berger, D., Häusler, I., & Lehmann, M. (2024). Imaging Localized Variable Capacitance During Switching Processes in Silicon Diodes by Time-Resolved Electron Holography.
Chicago-Zitierstil (17. Ausg.)Wagner, Tolga, Hüseyin Çelik, Dirk Berger, Ines Häusler, und Michael Lehmann. Imaging Localized Variable Capacitance During Switching Processes in Silicon Diodes by Time-Resolved Electron Holography. 2024.
MLA-Zitierstil (9. Ausg.)Wagner, Tolga, et al. Imaging Localized Variable Capacitance During Switching Processes in Silicon Diodes by Time-Resolved Electron Holography. 2024.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.