Wagner, T., Çelik, H., Berger, D., Häusler, I., & Lehmann, M. (2024). Imaging Localized Variable Capacitance During Switching Processes in Silicon Diodes by Time-Resolved Electron Holography.
Cita Chicago Style (17a ed.)Wagner, Tolga, Hüseyin Çelik, Dirk Berger, Ines Häusler, y Michael Lehmann. Imaging Localized Variable Capacitance During Switching Processes in Silicon Diodes by Time-Resolved Electron Holography. 2024.
Cita MLA (9a ed.)Wagner, Tolga, et al. Imaging Localized Variable Capacitance During Switching Processes in Silicon Diodes by Time-Resolved Electron Holography. 2024.
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