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Imaging Localized Variable Capacitance During Switching Processes in Silicon Diodes by Time-Resolved Electron Holography

Fuente: arXiv

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Bibliographic Details
Main Authors:	Wagner, Tolga, Çelik, Hüseyin, Berger, Dirk, Häusler, Ines, Lehmann, Michael
Format:	Preprint
Published:	2024
Subjects:	Applied Physics Materials Science
Online Access:	Acceder al recurso
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