Characterisation and simulation of stitched CMOS strip sensors
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arXiv
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| Main Authors: | , , , , , , , , , , , , , , , , , , , , , , |
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| Format: | Preprint |
| Published: |
2024
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| _version_ | 1866913350500220928 |
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| author | Davis, Naomi Arling, Jan-Hendrik Baselga, Marta Diehl, Leena Dingfelder, Jochen Gregor, Ingrid-Maria Hauser, Marc Hügging, Fabian Hemperek, Tomasz Jakobs, Karl Karagounis, Michael Koppenhöfer, Roland Kröninger, Kevin Lex, Fabian Parzefall, Ulrich Rodriguez, Arturo Sari, Birkan Sorgenfrei, Niels Spannagel, Simon Sperlich, Dennis Wang, Tianyang Weingarten, Jens Zatocilova, Iveta |
| author_facet | Davis, Naomi Arling, Jan-Hendrik Baselga, Marta Diehl, Leena Dingfelder, Jochen Gregor, Ingrid-Maria Hauser, Marc Hügging, Fabian Hemperek, Tomasz Jakobs, Karl Karagounis, Michael Koppenhöfer, Roland Kröninger, Kevin Lex, Fabian Parzefall, Ulrich Rodriguez, Arturo Sari, Birkan Sorgenfrei, Niels Spannagel, Simon Sperlich, Dennis Wang, Tianyang Weingarten, Jens Zatocilova, Iveta |
| contents | In high-energy physics, there is a need to investigate alternative silicon sensor concepts that offer cost-efficient, large-area coverage. Sensors based on CMOS imaging technology present such a silicon sensor concept for tracking detectors. The CMOS Strips project investigates passive CMOS strip sensors fabricated by LFoundry in a 150nm technology. By employing the technique of stitching, two different strip sensor formats have been realised. The sensor performance is characterised based on measurements at the DESY II Test Beam Facility. The sensor response was simulated utilising Monte Carlo methods and electric fields provided by TCAD device simulations. This study shows that employing the stitching technique does not affect the hit detection efficiency. A first look at the electric field within the sensor and its impact on generated charge carriers is being discussed. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2405_08667 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Characterisation and simulation of stitched CMOS strip sensors Davis, Naomi Arling, Jan-Hendrik Baselga, Marta Diehl, Leena Dingfelder, Jochen Gregor, Ingrid-Maria Hauser, Marc Hügging, Fabian Hemperek, Tomasz Jakobs, Karl Karagounis, Michael Koppenhöfer, Roland Kröninger, Kevin Lex, Fabian Parzefall, Ulrich Rodriguez, Arturo Sari, Birkan Sorgenfrei, Niels Spannagel, Simon Sperlich, Dennis Wang, Tianyang Weingarten, Jens Zatocilova, Iveta Instrumentation and Detectors In high-energy physics, there is a need to investigate alternative silicon sensor concepts that offer cost-efficient, large-area coverage. Sensors based on CMOS imaging technology present such a silicon sensor concept for tracking detectors. The CMOS Strips project investigates passive CMOS strip sensors fabricated by LFoundry in a 150nm technology. By employing the technique of stitching, two different strip sensor formats have been realised. The sensor performance is characterised based on measurements at the DESY II Test Beam Facility. The sensor response was simulated utilising Monte Carlo methods and electric fields provided by TCAD device simulations. This study shows that employing the stitching technique does not affect the hit detection efficiency. A first look at the electric field within the sensor and its impact on generated charge carriers is being discussed. |
| title | Characterisation and simulation of stitched CMOS strip sensors |
| topic | Instrumentation and Detectors |
| url | https://arxiv.org/abs/2405.08667 |