Saved in:
Bibliographic Details
Main Authors: Magagnin, Grégoire, Bouaziz, Jordan, Berre, Martine Le, Gonzalez, Sara, Deleruyelle, Damien, Vilquin, Bertrand
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2405.09345
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866914796802146304
author Magagnin, Grégoire
Bouaziz, Jordan
Berre, Martine Le
Gonzalez, Sara
Deleruyelle, Damien
Vilquin, Bertrand
author_facet Magagnin, Grégoire
Bouaziz, Jordan
Berre, Martine Le
Gonzalez, Sara
Deleruyelle, Damien
Vilquin, Bertrand
contents Over the last fifteen years, ferroelectric and antiferroelectric ultra thin films based on fluorite-structured materials have drawn significant attention for a wide variety of applications requiring high integration density. Antiferroelectric $ZrO_2$, in particular, holds significant promise for nanosupercapacitors, owing to its potential for high energy storage density (ESD) and high efficiency ($η$). This work assesses the potential of high-performance $Hf_{1-x}Zr_{x}O_2$ thin films encapsulated by TiN electrodes that show linear dielectric (LD), ferroelectric (FE), and antiferroelectric (AFE) behavior. Oxides on silicon are grown by magnetron sputtering and plasma-enhanced atomic layer deposition. ESD and $η$ are compared for FE, AFE, and LD samples at the same electrical field (3.5 MV/cm). As expected, ESD is higher for the FE sample ($95 J/cm^3$), but $η$ is ridiculously small ($\approx$ 55%), because of the opening of the FE hysteresis curve inducing high loss. Conversely, LD samples exhibit the highest efficiency (nearly 100%), at the expense of a lower ESD. AFE $ZrO_2$ thin film strikes a balance between FE and LD behavior, showing reduced losses compared to the FE sample but an ESD as high as $52 J/cm^3$ at 3.5 MV/cm. This value can be further increased up to $84 J/cm^3$ at a higher electrical field (4.0 MV/cm), with an $η$ of 75%, among the highest values reported for fluorite-structured materials, offering promising perspectives for future optimization.
format Preprint
id arxiv_https___arxiv_org_abs_2405_09345
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Comparative Performance of Fluorite-Structured Materials for Nanosupercapacitor Applications
Magagnin, Grégoire
Bouaziz, Jordan
Berre, Martine Le
Gonzalez, Sara
Deleruyelle, Damien
Vilquin, Bertrand
Applied Physics
Materials Science
Over the last fifteen years, ferroelectric and antiferroelectric ultra thin films based on fluorite-structured materials have drawn significant attention for a wide variety of applications requiring high integration density. Antiferroelectric $ZrO_2$, in particular, holds significant promise for nanosupercapacitors, owing to its potential for high energy storage density (ESD) and high efficiency ($η$). This work assesses the potential of high-performance $Hf_{1-x}Zr_{x}O_2$ thin films encapsulated by TiN electrodes that show linear dielectric (LD), ferroelectric (FE), and antiferroelectric (AFE) behavior. Oxides on silicon are grown by magnetron sputtering and plasma-enhanced atomic layer deposition. ESD and $η$ are compared for FE, AFE, and LD samples at the same electrical field (3.5 MV/cm). As expected, ESD is higher for the FE sample ($95 J/cm^3$), but $η$ is ridiculously small ($\approx$ 55%), because of the opening of the FE hysteresis curve inducing high loss. Conversely, LD samples exhibit the highest efficiency (nearly 100%), at the expense of a lower ESD. AFE $ZrO_2$ thin film strikes a balance between FE and LD behavior, showing reduced losses compared to the FE sample but an ESD as high as $52 J/cm^3$ at 3.5 MV/cm. This value can be further increased up to $84 J/cm^3$ at a higher electrical field (4.0 MV/cm), with an $η$ of 75%, among the highest values reported for fluorite-structured materials, offering promising perspectives for future optimization.
title Comparative Performance of Fluorite-Structured Materials for Nanosupercapacitor Applications
topic Applied Physics
Materials Science
url https://arxiv.org/abs/2405.09345