Identity Overlap Between Face Recognition Train/Test Data: Causing Optimistic Bias in Accuracy Measurement

Fuente: arXiv

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Bibliographic Details
Main Authors:	Wu, Haiyu, Tian, Sicong, Gutierrez, Jacob, Bhatta, Aman, Öztürk, Kağan, Bowyer, Kevin W.
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2405.09403